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Journal of the Korean Chemical Society (JKCS)

ISSN 1017-2548(Print)
ISSN 2234-8530(Online)
Volume 35, Number 5
JKCSEZ 35(5)
October 20, 1991 

The Thickness Determination of Silicone Resin on Zinc Electroplated Steels using Compton Scattering

Compton 산란선을 이용한 아연계 전기도금강판 표면의 Slicone Resin Film 두께측정
Jae Chun So, DoHyung Lee

소재춘, 이도형
X-ray Compton 산란선의 강도를 측정하여 내지문처리재(Anti-fingerprint Steel)의 표면에 Coating 되어 있는 Silicone resin film의 두께를 신속하게 측정할 수 있는 새로운 분석방법을 연구하였다. Silicone resin과 같은 유기수지들은 C, H, O, Si 등과 같은 경원소들로 구성되어 있어 compton 산란선의 강도가 높게 나타나는데 이러한 성질을 이용, X-ray tube로부터 발생된 RhKα 선을 시료표면에 조사한 후 발생된 RhKα compton 산란선의 강도를 측정하여 silicone resin film의 두께를 구하였다. 검량곡선 작성결과 0.2 ~ 5.0 μm 범위에서 직선성을 나타냈으며 두께측정에 대한 정확도는 0.22 μm 이었다.

A method to determine the thickness of silicone resin film on zinc eletroplated steel using X-ray compton scattering was investigated. On the basis of the fact that compton scattering process predominates over photoelectric absorption for the light elements such as C, H, O and Si, the compton scattered line of RhKα was used to determine the thickness of silicone resin. In this method, the standard calibration curve for thickness determination of silicone resin film was found to be linear in the range of 0.2~5.0 μm film thickness. The analytical results agreed well with those obtained by the gravimetric method and the accuracy was found to be 0.22 μm.

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