Current time in Korea 16:36 Dec 03 (Thu) Year 2020 KCS KCS Publications
KCS Publications
My Journal  Log In  Register
HOME > Search > Browsing(BKCS) > Archives

Bulletin of the Korean Chemical Society (BKCS)

ISSN 0253-2964(Print)
ISSN 1229-5949(Online)
Volume 29, Number 4
BKCSDE 29(4)
April 20, 2008 

 
Title
Orientations of Polycrystalline ZnO at the Buried Interface of Oxide Thin Film Transistors (TFTs): A Grazing Incidence X-ray Diffraction Study
Author
J. Y. Kim, S.-H. Ko Park, H. Y. Jeong, C. Park, S.-Y. Choi, J.-Y. Choi, S.-H. Han, T. H. Yoon*
Keywords
Grazing-incidence x-ray diffraction, ZnO, Thin film transistors
Abstract
No Abstract
Page
727 - 728
Full Text
PDF