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Bulletin of the Korean Chemical Society (BKCS)

ISSN 0253-2964(Print)
ISSN 1229-5949(Online)
Volume 29, Number 4
BKCSDE 29(4)
April 20, 2008

Title	Orientations of Polycrystalline ZnO at the Buried Interface of Oxide Thin Film Transistors (TFTs): A Grazing Incidence X-ray Diffraction Study
Author	J. Y. Kim, S.-H. Ko Park, H. Y. Jeong, C. Park, S.-Y. Choi, J.-Y. Choi, S.-H. Han, T. H. Yoon*
Keywords	Grazing-incidence x-ray diffraction, ZnO, Thin film transistors
Abstract	No Abstract
Page	727 - 728
Full Text	PDF

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