ISSN 1017-2548(Print)
ISSN 2234-8530(Online)
Volume 44, Number 1
JKCSEZ 44(1)
February 20, 2000 

The wavelength of the surface plasmon absorption depends on the dielectric matrix. TiO2/SiO2 complex oxide films doped with Au nanoclusters were prepared by sol-gel spin-coating method using Ti(OPr i)4, Si(OEt)4, and HAuCl4·7H20. The wavelength of the maximum absorption of Au nanoehrsters in the TiO2/SiO2 thin films was obtained with lineality from 540 nm to 615 nm depending on the molar ratio of TiO2. The particle sizes and structures of these nanoclusters have been identified through a TEM and X-ray diffraction patterns. The dielectric constants of TiO2/SiO2 thin films were calculated from the experimental results.