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Journal of the Korean Chemical Society (JKCS)

ISSN 1017-2548(Print)
ISSN 2234-8530(Online)
Volume 52, Number 6
JKCSEZ 52(6)
December 20, 2008 

Trace Elements Analysis of Tungsten Matrix with ICP-MS

ICP-MS에 의한 Tungsten Matrix 중의 미량원소분석
Sung Ho Lee*

ICP-MS, Tungsten, 미량원소, 분석, ICP-AES, DC Arc , ICP-MS, Tungsten, Trace Element, Analysis, ICP-AES, DC Arc
낮은 검출한계에 주안점을 두고서 ICP-MS를 이용하여 텅스텐 매트릭스에서 미량원소분석을 연구 하였다. 먼저 표준용액을 이용하여 기기의 최적조건을 찾은 다음 미량분석을 실시하였다. 텅스텐 매트릭스에 서 대표적인 원소의 3σ 검출한계를 구하였으며, 기존의 ICP-AES, DC-Arc 등의 방법과 비교 분석하였다. 질량 수 61 이상의 대부분 원소에 대해서는 방해가 거의 없으며 낮은 검출한계를 보였다. 텅스텐 매트릭스에 표준 물질 일정 농도들을 첨가하여 회수율을 구한 결과 첨가량과 잘 일치하는 결과를 얻었다. 또한 실제 시료의 분 석결과 기존의 ICP-AES와 DC Arc 등의 분석결과보다 우수한 결과를 얻었다.

A method for the determination of trace element analysis in tungsten matrix by inductively coupled plasma mass spectrometry(ICP-MS) is described with an emphasis on the low detection limit. Instrumental conditions adequate to trace element analysis are established with aqueous standard solution and tungsten matrix. The limits of detection(3σ) of the elements for this method were determined and compared with those obtained by inductively coupled plasma atomic emission spectroscopy(ICP-AES) and direct current carbon arc emission spectroscopy(DC Arc). Little interference and very low limits of detection for the mass species bigger than atomic number 61 were observed. Analytical reliability of the proposed method was estimated by analyzing a spiked solution and the results indicated that the accuracy of multi-element analysis is satisfactory. The analytical result of the proposed method was more excellent than that of analyzed with ICP-AES and DC Arc in real tungsten samples.

637 - 648
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