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Bulletin of the Korean Chemical Society (BKCS)

ISSN 0253-2964(Print)
ISSN 1229-5949(Online)
Volume 15, Number 12
BKCSDE 15(12)
December 20, 1994 

Atomic Force Microscopy Study of Conducting Layered Transition Metal Ditellurides
Sung-Jin Kim*, So-Jung Park, Hoon-Jung Oh, Il Cheol Jeon, Sunae Song
Atomic force microscopy (AFM) images of two conducting layered transition-metal ditellurides, TaTe2 and Ta0.5V0.5Te2, were examined and their surface and bulk structural features were compared. All the measured unit cell parameters from AFM image were consistent and in complete agreement with the results of the X-ray diffraction. The microscopic structures of corrugated surface tellurium sheets were strongly affected by the modification of metal double zig-zag chains underneath Te surface. Large difference in the height amplitudes of AFM images in TaTe2 and Ta0.5V0.5Te2 phases was observed and this reflects large difference in the surface electron densities of two phases. On surface, the shorter intralayer Te…Te contacts in TaTe2 induce more electron transfer from Te p-block bands to Ta d-block bands, thus electron density on surface observed in TaTe2 is much lower than that of Ta0.5V0.5Te2. However, in bulk, interlayer Te…Te contacts in V substituted phase are shorter than those in TaTe2 phase, thus tellurium-to-metal electron transfer occurs more easily in Ta0.5V0.5Te2 phase.
1098 - 1103
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