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Bulletin of the Korean Chemical Society (BKCS)

ISSN 0253-2964(Print)
ISSN 1229-5949(Online)
Volume 14, Number 3
BKCSDE 14(3)
March 20, 1993 

Analysis of Steric Repulsion Forces in Atomic Force Microscope with Polyethylene Oxide in Aqueous Media
Sang Il Jeon*, Joseph D. Andrade
We present a theoretical analysis for the use of long-range intermolecular steric repulsion forces for imaging by atomic force microscope (AFM). Polyethylene oxide (PEO) is assumed to be terminally attaching to a spherical AFM tip in aqueous media. Only two long-range intermolecular forces (van der Waals attraction and steric repulsion) are considered. All calculated forces are near 10-11 N, which should not produce deformation of the soft protein surface. Calculations are presented as a function of surface density and chain length of terminally attached PEO, and other variables. Longer chain length and maximal surface density of terminally attached PEO to a smaller sized spherical AFM tip (modified AFM system) is appropriate to obtain optimum images of proteins on the surface.
352 - 356
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