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Bulletin of the Korean Chemical Society (BKCS)

ISSN 0253-2964(Print)
ISSN 1229-5949(Online)
Volume 12, Number 5
BKCSDE 12(5)
May 20, 1991

Title	A Sensitivity Analysis for Three-Parameter Ellipsometry
Author	Gyusung Chung, Duckhwan Lee*, Woon-Kie Paik
Keywords
Abstract	In the three-parameter ellipsometry (TPE), also known as reflectance-ellipsometry, the ellipsometric measurements, Ψ, and Δ, are combined with the reflectometric measurement, R, to determine the optical parameters and the thickness of a light-absorbing thin film. The constant Ψ, Δ and R surfaces are analyzed graphically to understand the nature of the TPE solutions. A sensitivityanalysis is shown to be useful not only for identifying the film properties which affect most the TPE measurements, but also for estimating errors in film properties arising from the uncertainties in measurements.
Page	477 - 483
Full Text	PDF

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