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Bulletin of the Korean Chemical Society (BKCS)

ISSN 0253-2964(Print)
ISSN 1229-5949(Online)
Volume 24, Number 5
BKCSDE 24(5)
May 20, 2003 

Single Nanoparticle Ion Trap (SNIT): A Novel Tool for Studying in-situ Dynamics of Single Nanoparticles
Sung Cheol Seo, Seung Kyun Hong, Doo Wan Boo
Single nanoparticle, Ion trap, in-situ dynamics, Mass analysis
The development of high performance single nanoparticle ion trap (SNIT) apparatus for studying in-situ dynamics of single nanoparticles in controlled environments is described. The performance of SNIT apparatus has been evaluated for 500 nm SiO2 particles. The mass resolution of ~100 ppm and the capability of varying the charge states independently have been demonstrated.
552 - 554
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